Thanks for that tip. It seems BlueTooth uses both a lot of static IRAM and DRAM. Probably I will have to switch to a chip with some SPRAM and I can move some DRAM usage to that and then some IRAM can move to DRAM.
Do you know why BlueTooth uses so much of this RAM? Seems to use about 14K DRAM and ...
Search found 54 matches
- Sun Jan 12, 2025 6:52 pm
- Forum: ESP-IDF
- Topic: IRAM0 segment data does not fit
- Replies: 2
- Views: 1202
- Fri Jan 10, 2025 10:33 pm
- Forum: ESP-IDF
- Topic: IRAM0 segment data does not fit
- Replies: 2
- Views: 1202
IRAM0 segment data does not fit
I am adding a BlueTooth feature to my application, and now during linking I am getting link errors:
ld.exe: myapp.elf section `.iram0.text' will not fit in region `iram0_0_seg'
ld.exe: IRAM0 segment data does not fit.
ld.exe: region `iram0_0_seg' overflowed by 6712 bytes
It looks like the BT ...
ld.exe: myapp.elf section `.iram0.text' will not fit in region `iram0_0_seg'
ld.exe: IRAM0 segment data does not fit.
ld.exe: region `iram0_0_seg' overflowed by 6712 bytes
It looks like the BT ...
- Tue Jul 23, 2024 3:48 pm
- Forum: ESP-IDF
- Topic: Is OTA Update of encrypted application possible?
- Replies: 8
- Views: 55485
Re: Is OTA Update of encrypted application possible?
You can duplicate the OTA procedure and switch to use esp_partition_write_raw to write the encrypted data.Can you please describe in more details your OTA procedure?
I agree with you that Espressif pre-encrypted method is overkill if you already have generated own flash encryption keys.
- Wed Jun 05, 2024 1:49 am
- Forum: ESP-IDF
- Topic: Spurious ( False Positive ) factory / test boot condition detection
- Replies: 7
- Views: 2605
Re: Spurious ( False Positive ) factory / test boot condition detection
Instead of input mode with pull up, just before reset, I set it to output mode and set 0 to high. That seems to solve the false detection.
- Wed Jun 05, 2024 1:35 am
- Forum: ESP-IDF
- Topic: Spurious ( False Positive ) factory / test boot condition detection
- Replies: 7
- Views: 2605
Re: Spurious ( False Positive ) factory / test boot condition detection
Well, I switched back to factory detection, since the app wouldn't programmatically switch to the test partition for booting. Now I am getting false positive on factory condition detected.
I also noticed it happens consistently when doing a reboot from within app, which is calling "ESP.restart ...
I also noticed it happens consistently when doing a reboot from within app, which is calling "ESP.restart ...
- Tue Jun 04, 2024 10:52 pm
- Forum: ESP-IDF
- Topic: Spurious ( False Positive ) factory / test boot condition detection
- Replies: 7
- Views: 2605
Re: Spurious ( False Positive ) factory / test boot condition detection
Since I changed to the boot to trigger the test app partition, I changed the corresponding code in my app to allow the user to manually change to this as the boot partition. The operation reports success, but on reboot, it continues to boot my app0 partition.
So after a successful change, I tried ...
So after a successful change, I tried ...
- Tue Jun 04, 2024 6:06 pm
- Forum: ESP-IDF
- Topic: Spurious ( False Positive ) factory / test boot condition detection
- Replies: 7
- Views: 2605
Re: Spurious ( False Positive ) factory / test boot condition detection
Enabled the pull up, and it seems to have helped. Recent crashes did not affect the boot process.
- Fri May 31, 2024 6:35 am
- Forum: ESP-IDF
- Topic: Spurious ( False Positive ) factory / test boot condition detection
- Replies: 7
- Views: 2605
Re: Spurious ( False Positive ) factory / test boot condition detection
The two boards are not the same.
On the custom board with ESP-WROOM-32E, IO0 is only exposed to serial header as DTR for programming. I do have that hooked up via Serial2USB module during development for these runs.
On the board with the NodeMCU Devkit with 32E, IO0 goes to level shifter input so ...
On the custom board with ESP-WROOM-32E, IO0 is only exposed to serial header as DTR for programming. I do have that hooked up via Serial2USB module during development for these runs.
On the board with the NodeMCU Devkit with 32E, IO0 goes to level shifter input so ...
- Thu May 30, 2024 6:36 pm
- Forum: ESP-IDF
- Topic: Spurious ( False Positive ) factory / test boot condition detection
- Replies: 7
- Views: 2605
Spurious ( False Positive ) factory / test boot condition detection
In case of application problems, I want the user to be able to boot to a factory application, where application firmware can be updated.
I thought I may as well re-use the button already on IO0, but have been getting spurious detection. I first tried the factory configuration, and now switched to ...
I thought I may as well re-use the button already on IO0, but have been getting spurious detection. I first tried the factory configuration, and now switched to ...
- Mon Apr 08, 2024 5:41 pm
- Forum: ESP-IDF
- Topic: SPI DMA crashes when using WiFi
- Replies: 6
- Views: 4128
Re: SPI DMA crashes when using WiFi
having flash as a source is an uncommon enough scenario
Huh? Where else would a pixmap image come from? It would always originate in flash.
Yeah, I was surprised to see how the lower level SPI routines are implemented when I investigated further. It seems naive to me, but I guess it's up to the ...
Huh? Where else would a pixmap image come from? It would always originate in flash.
Yeah, I was surprised to see how the lower level SPI routines are implemented when I investigated further. It seems naive to me, but I guess it's up to the ...